Incize is your partner in semiconductor characterization and modeling for design of digital, analog/RF and harsh environment applications.
Substrate characterization, simulation and modelling for a very wide range of applications.
1/f, RTN and thermal (RF) noise measurements and modelling
Access to state-of-the-art equipment and experience in the field of radiation hardness measurements and modeling.
Incize is recruiting a junior engineer / technician.
Incize organises a one-day tutorial about Silicon-on-Insulator (SOI) technology for low power and RF applications.
Incize is recruiting a senior semiconductor R&D engineer.
- S. Makovejev, B. Kazemi Esfeh, J.-P. Raskin, D. Flandre, V. Kilchytska, “Threshold Voltage Extraction Techniques and Temperature Effect in Context of Global Variability in UTBB MOSFETs”, European Solid-State Device Research Conference ESSDERC, Sep. 2013
- Makovejev, S., Kazemi Esfeh, B., Barral, V., Planes, N., Haond, M., Flandre, D., & Raskin, J.-P. (2014). Wide Frequency Band Assessment of 28 nm FDSOI Technology Platform for Analogue and RF Applications. Ultimate Integration on Silicon, ULIS.