Incize is your partner in semiconductor characterization and modeling for design of digital, analog/RF and harsh environment applications.
Substrate characterization, simulation and modelling for a very wide range of applications.
1/f, RTN and thermal (RF) noise measurements and modelling
Access to state-of-the-art equipment and experience in the field of radiation hardness measurements and modeling.
Incize is attending the Paris Space Week. We are excited to present and challenge our activities of RadHard testing and simulations during B2B meetings with major players in the space and aeronautics industries.
Incize participated, among few start-up companies from Belgium, in the royal state visit to the European Space Agency ESA campus in The Netherlands (ESTEC), with HM King Philippe of Belgium.
Incize organises a one-day tutorial about Silicon-on-Insulator (SOI) technology for low power and RF applications.
- S. Makovejev, B. Kazemi Esfeh, J.-P. Raskin, D. Flandre, V. Kilchytska, “Threshold Voltage Extraction Techniques and Temperature Effect in Context of Global Variability in UTBB MOSFETs”, European Solid-State Device Research Conference ESSDERC, Sep. 2013
- Makovejev, S., Kazemi Esfeh, B., Barral, V., Planes, N., Haond, M., Flandre, D., & Raskin, J.-P. (2014). Wide Frequency Band Assessment of 28 nm FDSOI Technology Platform for Analogue and RF Applications. Ultimate Integration on Silicon, ULIS.