Incize is your partner in semiconductor characterization and modeling for design of digital, analog/RF and harsh environment applications.

Substrates

panel1

Substrate characterization, simulation and modelling for a very wide range of applications.

Noise

panel3

1/f, RTN and thermal (RF) noise measurements and modelling

Radiation

panel4

Access to state-of-the-art equipment and experience in the field of radiation hardness measurements and modeling.

News

A new opening at Incize !

07/07/2016
Incize_logo

Incize is recruiting a junior engineer / technician.

A Practical Guide to SOI

13/06/2016
Incize_logo

Incize organises a one-day tutorial about Silicon-on-Insulator (SOI) technology for low power and RF applications.

Incize is hiring !

31/03/2016
Incize_logo

Incize is recruiting a senior semiconductor R&D engineer.

Publications

ESSDERC 2013

03/10/2014

  1. S. Makovejev, B. Kazemi Esfeh, J.-P. RaskinD. Flandre, V. Kilchytska, “Threshold Voltage Extraction Techniques and Temperature Effect in Context of Global Variability in UTBB MOSFETs”, European Solid-State Device Research Conference ESSDERC, Sep. 2013

Ultimate Integration on Silicon 2014

03/10/2014

  1. Makovejev, S., Kazemi Esfeh, B., Barral, V., Planes, N., Haond, M., Flandre, D., & Raskin, J.-P. (2014). Wide Frequency Band Assessment of 28 nm FDSOI Technology Platform for Analogue and RF Applications. Ultimate Integration on Silicon, ULIS.

Newsletter

Subscribe to our newsletter in less than 2 minutes!

X