we innovatively characterize
Our expertise covers a wide range of characterization environments including dc, ac, RF, high-frequency noise and non-linear characterization.
We employ innovative RF techniques to characterize devices and materials in all fields of operation (not only RF).
UCL (Université catholique de Louvain)
EPL (Ecole Polytechnique de Louvain)
WELCOME (Wallonia Electronics and Communications Measurements)