Ultimate Integration on Silicon 2014


  1. Makovejev, S., Kazemi Esfeh, B., Barral, V., Planes, N., Haond, M., Flandre, D., & Raskin, J.-P. (2014). Wide Frequency Band Assessment of 28 nm FDSOI Technology Platform for Analogue and RF Applications. Ultimate Integration on Silicon, ULIS.

Solid-State Electronics 2012


  1. V. Kilchytska, M. K. Md Arshad, S. Makovejev, S. Olsen, F. Andrieu, T. Poiroux, O. Faynot, J.-P. Raskin, and D. Flandre, “Ultra-thin body and thin-BOX SOI CMOS technology analog figures of merit,” Solid-State Electronics, vol. 70, pp. 50-58, 2012.

IEEE Transactions on Electron Devices 2011


  1. S. Makovejev, S. Olsen, and J.-P. Raskin, “RF Extraction of Self-Heating Effects in FinFETs,” IEEE Transactions on Electron Devices, vol. 58, no. 10, pp. 3335-3341, 2011.

IEEE Transactions on Electron Devices 2013


S. Makovejev, S. H. Olsen, V. Kilchytska, and J.-P. Raskin, “Time and Frequency Domain Characterization of Transistor Self-Heating,” IEEE Transactions on Electron Devices, vol. 60, no. 6, pp. 1844-1851, 2013.