RF on-wafer characterisation

Characterisation at very high frequencies imposes new measurement constraints compared with DC. In this module you will learn:
  • How to choose the equipment, including probes, probe station and cables
  • How to choose test structures and the requirements for RF pads
  • Considerations for design of RF test-structures and how to optimise for minimum foot print
  • Most common active and passive test structures (transmission lines, cross-talk, etc.)
  • De-embedding techniques
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