Variability in SOI
Scaling of semiconductor devices brings new challenges related to variability of device geometry and doping. This issue is of particular importance in FDSOI as the thickness of silicon and buried oxide layers are in nano-scale. In this module you will learn:
  • Origin of variability in CMOS
  • Variability issues in SOI and their impact on the device and circuit performance
  • What implications designers are facing due to variability
  • Solutions how to deal with variability at the design and the technology levels
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